Data Cruncher and a Datalog File
This is a sample of datalog on ASL - 100% text file
Datalog in Database Format
We move the data from text to database format
Datalog Cruncher - produces a list of lots
Wafer map versus Datalog
The high levels sow a trim problem from wafersort
Best Electronics Components Co., Inc.
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Device and Wafer data acquisition tools for engineer and in house manufacturing groups. This is web based for easy access to production and engineering data from wafer sort to final test for creating detial histgrams and other vislual report to assist you and your customer with moniotring and increasing your over all device Proframance.
BECCI know that most test cost are based on a price per unit for units processed on a company owned equipment.
Our focus is on test yield and test engineering support. Our manufacturing focus is yield driven unlike most of our competitors who are UPH driven. Our focus on yield is supported by our "test data management"
system and strong test engineering group. Maximizing test yield vs UPH requires more frequent contactor or probe change which increases the down time and material cost of test(contacts).
A yield focused test process will appear to have a higher process cost per hour due to the higher down time resulting form increased frequency of contact or change as well as the additional engineering and IT staff to support this process.
BECCI's yield focused process priced per unit puts the burden of test optimization on BECCI. A UPH driven process priced per hour reduces the emphasis on yield and test optimization and typically lacks revenue to support the engineering services offered by BECCI.
The difference to our customer in a yield driven process vs UPH is lower material cost per unit processed and higher revenue per dollar of material content.
Our Data Cruncher™ software is a main part of this data analisys and optimization that is used by our engineering staff to achieve the highest quality yields for our cusotomers.
