Best Electronics and Components provides quick turn production testing of analog/mixed signal QFN / DNF, CSP, SM & PDIP semiconductor devices as well as Mosfet specialty test like (Gate Charge, IL, RG) as well as engineering and manufacturing services; test program development, tri-temperature wafer sorting, electrical test, high volume chip scale inspection, die tape & reel and data collection / analysis of every test on every device.

We specialize in DFN /QFN packages using our FFH handler for high speed performance check out the Video....

 

 

 

As well as Specialty test for Mosfet's. We developed Single Insertion Solution (SIS) that are used on top of current tester that Integrate all four tests (Gate Charge, IL, RG and DC Tests) into the TMT test platform to provide a one/inspection solution for our MOSFET Customers. We also have Scalable Indexed Parallel Solution (SIPS) for high-speed turret handlers.

Increase Flexibility and ensure quality.
Reduce to a Single insertion (3 or 4 insertions to one insertion)
Reduce to a Single summary sheet & datalog
Reduce handling = Less Mechanical Stress = Fewer Failures, Higher Yield & Better Reliability
Reduce capital investment
Reduce cycle time
Don’t have to build additional gate charge tester.
Increased Productivity